Expertise

Project and Product Management

Perform complete project/product management and development in the areas shown below.

Automation

Remote control, automated motorized systems, sensors, mechanics, and optics.

Electronics

Electrical systems for automation, remote control, and sensors.

Mechanical Design

Design of mechanical systems with integrated optics, electronics, and motorized systems.

Programming

C, C++, C#, Fortran, MATALB, LABVIEW, IDL, Basic, Assembly.

Interferometry

Development of commercial interferometric software for the best commercial fiber-optic-tip profiler instrumentation sold in the market today. Development of commercial, highly customizable, interferometric software, IntelliWave (TM), for the optical industry. Specializing in custom products and applications using IntelliWave’s expandable Plug-In Architecture.

Scatterometry

Instrument design and fabrication of high speed fully automated three-dimensional scattered light measurement systems. Software design and development for scattered light data acquisition and data analysis. Co-designed, built, and installation of multi wavelength, fully automated (ten degrees of freedom), scatterometer instrumentation for Martin Marietta, Lockheed, and Santa Barbra Research Center for use in investigation of materials for light sensitive space based applications. Designed miniature scatterometer instrumentation for possible use in orbiting satellite systems for the purpose of real-time monitoring of primary mirror contamination at the University of Arizona Optical Sciences Center.

Image Processing

Research and development of state‑of‑the‑art real‑time image processing systems and software algorithms for several applications including electron tunneling microscope image analysis, three dimensional light scatter processing, and object finding/sizing/characterization. Designed and built specialized electrical circuits and optical mechanisms for CCD imagers.

Spectroscopy

Design and development of spectrometer scanners, acquisition systems, and analysis software.

 

National Awards

Photonics Spectra  1993:                  Top Ten: OmniScatter – A hemispherical light scatter measurement instrument.

Lasers and Optronics 1993:            Top Ten: OmniScatter – A hemispherical light scatter measurement instrument.

Patents

Patent #5,615,294: “Apparatus for Collecting Light and its Method of Manufacture” using fused fiber optic bundle.

Patent #5,729,640: “Process of Acquiring, with an XY Scannable Array Camera, Light Emanated From a Subject”.

Patent #5,313,542: “Apparatus and Method of Rapidly Measuring Hemispherical Scattered or Radiated Light”.

Patent #5,475,617: “Process of Reconstructing a Single Data Profile of a Rapidly Measured Hemispherical Scattered or Radiated Light”.

Patent #7808654:   “High resolution three dimensional topography using a flatbed scanner”.

Patent #8004687: “Interferometric system with reduced vibration sensitivity and related method”

Patent #7,256,895: “Spherical Scattering-Light Device for Simultaneous Phase and Intensity Measurements”

Patent #7,483,145: “Simultaneous Phase Shifting Module for Use in Interferometry Using Single and Multiple Light Wavelengths

Patent #7,561,279: “Scanning Simultaneous Phase-Shifting Interferometer”

 Publications

  • Castonguay Raymond, Anderson Scott, Pompea M. Stephen, Shepard F. Donald, “Performance of a Fully Automated Scatterometer for BRDF and BTDF Measurements at Visible and Infrared Wavelengths”, SPIE Vol. 967 (1988).
  • Raymond J. Castonguay, “New generation high-speed high-resolution hemispherical Scatterometer”, SPIE Vol 1995 (1993), pp.152-165.
  • Raymond J. Castonguay, “Accuracy and repeatability results of OmniScatR a high-speed high-resolution three-dimensional scatterometer” SPIE Vol 2260 (1994), pp.74-82.
  • Raymond J. Castonguay, “OmniScatR: A high-speed high-resolution three-dimensional scatterometer measures complex scatter interference and diffraction patterns”, SPIE Vol 2260 (1994), pp.212-224.